- 29 Quai des Gresillons
, 92622 Gennevilliers, Cedex, France
World leader in Secondary Ion Mass Spectrometry (SIMS), Electron Probe Microanalysis (EPMA), Low Energy electron-induced X-ray Emission Spectrometry (LEXES) and Atom Probe Tomography (APT), the CAMECA instruments serve a broad range of laboratory and process control applications in end markets that include semiconductor, nano-science, biology, environment, geology, nuclear and material sciences.
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